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course:
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Electron Microscopy I
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type:
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lecture + exercises
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lecturer:
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Jäger, Spiecker
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semester:
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WS
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hours per week:
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3
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ECTS credits:
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4
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content:
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- The course gives an introduction to the fundamentals of transmission electron microscopy
in materials science:
- Fundamental aspects of transmission electron microscopy – elastic and inelastic electron scattering, instruments, particle optics, detectors
- Transmission electron microscopy in materials science – contrast and imaging techniques,
specimen preparation, dynamical and kinematical theory of electron diffraction contrast, image contrast of perfect crystals and of crystals with defects
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literature:
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- B. J. Fultz, J. M. Howe: Transmission Electron Microscopy and Diffractometry of
Materials. Springer-Verlag 2001.
- L. Reimer: Transmission Electron Microscopy - Physics of Image Formation and
Microanalysis. Springer-Verlag 1997.
- D. B. Williams, C. B. Carter: Transmission Electron Microscopy - A Textbook for Materials
Science. Plenum Press, New York 1996.
- E. Fuchs, H. Oppolzer, H. Rehme: Particle Beam Microanalysis, VCH-Verlag 1990.
- H. Alexander: Physikalische Grundlagen der Elektronenmikroskopie. Teubner Studienbücher,
Teubner-Verlag Stuttgart 1997.
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requirements:
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Bachelor
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examination:
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oral
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