course:

Electron Microscopy II

type:

lecture + exercises

lecturer:

Jäger, Spiecker

semester:

SS

hours per week:

3

ECTS credits:

4

content:

Analytical transmission electron microscopy (AEM) and its applications in the characterization of materials and in materials science:
- Methods of X-ray microanalysis
- Electron energy loss spectroscopy
- Energy-filtering transmission electron microscopy
- Scanning transmission electron microscopy
- Methods of convergent beam electron diffraction

The course gives an introduction to the most important techniques of AEM.

literature:

• 1. Principles of Analytical Electron Microscopy, Eds. D. C. Joy, A. D. Romig,Jr., J. I. Goldstein, Plenum Press New York 1996
• 2. L. Reimer: Transmission Electron Microscopy - Physics of Image Formation and Microanalysis. Springer-Verlag 1997
• 3. D. B. Williams, C. B. Carter: Transmission Electron Microscopy - A Textbook for Materials Science, Plenum Press, New York 1996
• 4. Materials Science and Technology (Eds. R.W.Cahn, P.Haasen, E.J.Kramer) Vol. 2 Characterization of Materials VCH 1992
• H. Alexander: Physikalische Grundlagen der Elektronenmikroskopie, Teubner Studienbücher, Teubner-Verlag Stuttgart 1997

requirements:

Bachelor / Microscopy with Electrons I

examination:

oral