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content:
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Materials Analysis I:
Particle beam methods and radiation methods - Overview -
Interaction of particle beams and radiation with matter - Fundamentals –
Methods of scanning electron microscopy (SEM, EBIC, CL, SAM)
Transmission electron microscopy (TEM): imaging, diffraction, analytical methods
Secondary-ion mass spectroscopy (SIMS)
Ion backscattering methods – Rutherford backscattering spectroscopy / ion
channeling
Materials Analysis II:
Electron emission spectroscopy techniques: photo electron spectroscopy (XPS, UPS, ESCA), Auger electron spectroscopy
Scanning tunneling microscopy and spectroscopy, atomic force microscopy
Methods of X-ray diffraction and X-ray topography
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literature:
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1. E. Fuchs, H. Oppolzer, H. Rehme: Particle Beam Microanalysis - Fundamentals, Methods and Applications; VCH
1990
2. J. M. Walls (Ed.): Methods of Surface Analysis; Cambridge University Press 1989
3. P. Goodhew, J. Humphreys, R. Beanland: Electron Microscopy and Analysis, Taylor and Francis 2001
4. P
E J Flewitt R K Wild, Physical methods for Materials Characterization, IoP Publishing 1994
5. R. Brundle, C.A. Evans Jr., S. Wilson (Eds.): Encyclopedia of Materials Characterization;
Butterworth-Heinemann 1992
6. Materials Science and Technology (Eds. R.W. Cahn, P. Haasen, E.J. Kramer): Vol. 2 Characterization of Materials VCH 1992
7. A. Putnis: Introduction to Mineral
Sciences, Ch.3,4; Cambridge University Press 1992
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